| Week |
Lecture Topics |
Link to Notes |
01 |
Course Organization
Course Expectations
Course Overview
Measurement Uncertainty
Magnetomtery I: Units and General Concepts |
Lecture Notes |
02 |
Magnetoresistance
Resistance Measurement in Thin Films
Magnetostriction |
Lecture Notes |
03 |
LABOR DAY: NO LECTURE |
|
04 |
Magnetometry II: Demagnetizing Fields
|
Lecture Notes |
05 |
Profilometry
Deposition Rate Measurements
Thin Films |
Lecture Notes |
06 |
Torque Magnetometry
Anisotropy |
Lecture Notes |
07 |
Stresses and Forces in Thin Films
Sputter Deposition |
Lecture Notes |
08 |
X-Ray Diffraction Basics
Thin Film Microstructure II |
Lecture Notes |
09 |
Magnetometry III: Interactions |
Lecture Notes |
10 |
Microfabrication
Process Variables
Beer’s Law |
Lecture Notes |
11 |
Device Probing
Geometrical Effects on MR |
Lecture Notes |
12 |
|
Lecture Notes |
13 |
Magneto-optic Kerr Effect
Compensation Phenomena |
Lecture Notes |
14 |
Guest Speaker: Magnetometry |
Lecture Notes |
15 |
Guest Speaker: Processing |
Lecture Notes |
