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| * Black et al., [[http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=4041869&tag=1 | Die Stacking (3D) Microarchitecture]], //MICRO 2006.// **[Required]** | * Black et al., [[http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=4041869&tag=1 | Die Stacking (3D) Microarchitecture]], //MICRO 2006.// **[Required]** | ||
| * Yoon et. al., [[http://users.ece.utexas.edu/~merez/vecc_asplos_2010.pdf | Virtualized and Flexible ECC for Main Memory]], //ASPLOS 2010// **[Required]** | * Yoon et. al., [[http://users.ece.utexas.edu/~merez/vecc_asplos_2010.pdf | Virtualized and Flexible ECC for Main Memory]], //ASPLOS 2010// **[Required]** | ||
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| + | ===== Recitation 9 ===== | ||
| + | |||
| + | ==== Review Set 7 ==== | ||
| + | * Perais et al., [[http://people.irisa.fr/Arthur.Perais/data/ISCA'14_EOLE.pdf | EOLE: Paving the Way for an Effective Implementation of Value Prediction]], //ISCA 2014.// **[[Required]]** | ||
| + | * Vijaykumar et al., [[https://engineering.purdue.edu/~vijay/papers/2002/srtr.pdf | Transient-Fault Recovery Using Simultaneous Multithreading]], //ISCA 2000.// **[[Required]]** | ||
| + | * Constantinides et al. [[https://users.ece.cmu.edu/~omutlu/pub/ace_micro07.pdf | Software-Based Online Detection of Hardware Defects: Mechanisms, Architectural Support, and Evaluation]], //MICRO 2007.// **[[Required]]** | ||